Potential for Ultrafast X-Ray Intensity Fluctuation Measurements
Mark Sutton
McGill University
Many of the properties of a material depend more on its microstructure than its atomic structure. Intensity fluctuation spectroscopy (IFS) is an ideal way to study dynamics and fluctuations in this microstructure. In this talk I will review the current state of IFS measurements and discuss the potential to extend these into the picosecond time regime. I will also discuss the proposed speckle experiments for the x-ray free electron laser project at Stanford.
